Additional Features:
- Wide sourcing range combined with low-level precision measurement capabilities
- All-in-one solution for power device characterization up to 1500 A & 10 kV
- Medium current measurement with high voltage bias (e.g. 500 mA at 1200 V)
- μΩ on-resistance measurement capability
- Accurate, sub-picoamp level, current measurement at high voltage bias
- Extensive device evaluation capabilities
- Capacitance measurement at up to /- 3 kV DC bias
- 10μs high power pulse measurement
- Temperature measurement capability
- High voltage/high current fast switch option for GaN current collapse effect characterization
- Improved measurement efficiency
- Automatically switch between high-voltage and high-current measurements without recabling
- Standard test fixtures with safety interlock for packaged power device testing
- Tested and supported high power 200 A on-wafer testing
The Keysight Agilent B1505A Power Device Analyzer / Curve Tracer has the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The Keysight Agilent HP B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The Keysight Agilent HP B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz – 5 MHz). Its ten-slot modular mainframe allows you to configure the Keysight Agilent B1505A to suit your measurement needs.
